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SpecEL-2000
Ellipsometry System
 
Á¦Á¶»ç Mikropack GmbH
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Specifications
Wavelength range 380-780 nm (standard) or 450-900 nm (optional)
Optical resolution 4.0 nm FWHM
Accuracy 0.1 nm thickness; 0.005% refractive index
Angle of incidence 70 ¢ª
Film thickness 1-5000 nm for single transparent film
Spot size 2 mm x 4 mm (standard) or 200 ¥ìm x 400 ¥ìm (optional)
Sampling time 3-15 seconds (minimum)
Kinetic logging 3 seconds
Mechanical tolerance (height) +/- 1.5 mm, angle +/- 1.0 ¢ª
Number of layers Up to 32 layers
Reference Not applicable
 
 
 
 
 
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