Auto nulling ellipsometry 와 Microscopy 기술 결합으로 1마이크론 정도의 수평해상도로
박막 표면 특성 분석이 가능한 제품입니다.
대부분의 Micro spot 분광옵션을 적용한 Non-imaging ellipsometer와 비교해도
1000배나 작은 Sample area에 대한 분석이 가능합니다.
적용 분야
Graphene
Nano materials 구조
Thin Film Reflectometry System, Thin film thickness measurement
박막두께측정, 나노박막 두께측정, 박막굴절율 측정
Protein spots on glass
PCBM on SiO2
SAM/SAM pattern
Solar cell on PET
Transparent substrate
Liquid/liquid interface
PMMA film on Si-Wafer
Monolayer
Imaging ellipsometry, Spectroscopic ellipsometry
Surface plasmon resonance analyzer
주요 특징
Direct sample visualization with an ellipsometric contrast image with a lateral resolution as small as 1 micron
Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
Real time ellipsometric contrast images provide a fast view of the surface, any defects or structures Parallel measurement of multiple areas within the selected field of view
Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates
07072 서울시 동작구 신대방1가길 38 (신대방 719번지 동작상떼빌) 106동 209호 (주)원우시스템즈 TEL : 02-533-6720 FAX : 02-533-9614 Santevill 106-209, 38, Sindaebang1ga-gil, Dongjak, Seoul, 07072, South Korea
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